Open access peer-reviewed Edited Volume

Scanning Probe Microscopy

Physical Property Characterization at Nanoscale

Edited by Vijay Nalladega

University of Dayton, United States of America

Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy.

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Scanning Probe MicroscopyPhysical Property Characterization at NanoscaleEdited by Vijay Nalladega

Published: April 27th 2012

DOI: 10.5772/2653

ISBN: 978-953-51-0576-3

eBook (PDF) ISBN: 978-953-51-4998-9

Copyright year: 2012

Books open for chapter submissions

25766 Total Chapter Downloads

5 Crossref Citations

11 Web of Science Citations

16 Dimensions Citations


Open access peer-reviewed

1. Multiple Material Property Characterization Using Induced Currents and Atomic Force Microscopy

By Vijay Nalladega, Shamachary Sathish, Kumar V. Jata and Mark P. Blodgett


Open access peer-reviewed

2. Tuning Fork Scanning Probe Microscopes - Applications for the Nano-Analysis of the Material Surface and Local Physico-Mechanical Properties

By Vo Thanh Tung, S.A. Chizhik, Tran Xuan Hoai, Nguyen Trong Tinh and V.V. Chikunov


Open access peer-reviewed

3. Statistical Analysis in Homopolymeric Surfaces

By Eralci M. Therézio, Maria L. Vega, Roberto M. Faria and Alexandre Marletta


Open access peer-reviewed

4. Polyamide-Imide Membranes of Various Morphology - Features of Nano-Scale Elements of Structure

By S.V. Kononova, G.N. Gubanova, K.A. Romashkova, E.N. Korytkova and D. Timpu


Open access peer-reviewed

5. Characterization of Complex Spintronic and Superconducting Structures by Atomic Force Microscopy Techniques

By L. Ciontea, M.S. Gabor, T. Petrisor Jr., T. Ristoiu, C. Tiusan and T. Petrisor


Open access peer-reviewed

6. Influence of Thickness on Structural and Optical Properties of Titanium Oxide Thin Layers

By Haleh Kangarlou and Saeid Rafizadeh


Open access peer-reviewed

7. Microtribological Behavior of Polymer-Nanoparticle Thin Film with AFM

By Xue Feng Li, Shao Xian Peng and Han Yan


Open access peer-reviewed

8. Nanomechanical Evaluation of Ultrathin Lubricant Films on Magnetic Disks by Atomic Force Microscopy

By Shojiro Miyake and Mei Wang


Open access peer-reviewed

9. Estimation of Grain Boundary Sliding During Ambient-Temperature Creep in Hexagonal Close-Packed Metals Using Atomic Force Microscope

By Tetsuya Matsunaga and Eiichi Sato


Open access peer-reviewed

10. Elastic and Nanowearing Properties of SiO2-PMMA and Hybrid Coatings Evaluated by Atomic Force Acoustic Microscopy and Nanoindentation"

By J. Alvarado-Rivera, J. Muñoz-Saldaña and R. Ramírez-Bon


Edited Volume and chapters are indexed in

  • Worldcat
  • OpenAIRE
  • Google Scholar
  • AZ ebsco
  • Base
  • CNKI

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