Open access peer-reviewed Edited Volume

Atomic Force Microscopy

Imaging, Measuring and Manipulating Surfaces at the Atomic Scale

Edited by Victor Bellitto

Naval Surface Warfare Center, United States of America

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.

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Atomic Force MicroscopyImaging, Measuring and Manipulating Surfaces at the Atomic ScaleEdited by Victor Bellitto

Published: March 23rd 2012

DOI: 10.5772/2673

ISBN: 978-953-51-0414-8

eBook (PDF) ISBN: 978-953-51-4987-3

Copyright year: 2012

Books open for chapter submissions

54955 Total Chapter Downloads

28 Crossref Citations

97 Web of Science Citations

103 Dimensions Citations


Open access peer-reviewed

1. Crystal Lattice Imaging Using Atomic Force Microscopy

By Vishal Gupta


Open access peer-reviewed

2. Atomic Force Microscopy in Optical Imaging and Characterization

By Martin Veis and Roman Antos


Open access peer-reviewed

3. Magnetic Force Microscopy: Basic Principles and Applications

By F.A. Ferri, M.A. Pereira-da-Silva and E. Marega Jr.


Open access peer-reviewed

4. Vibration Responses of Atomic Force Microscope Cantilevers

By Thin-Lin Horng


Open access peer-reviewed

5. Wavelet Transforms in Dynamic Atomic Force Spectroscopy

By Giovanna Malegori and Gabriele Ferrini


Open access peer-reviewed

6. Nanoscale Effects of Friction, Adhesion and Electrical Conduction in AFM Experiments

By Marius Enachescu


Open access peer-reviewed

7. Measurement of the Nanoscale Roughness by Atomic Force Microscopy: Basic Principles and Applications

By R.R.L. De Oliveira, D.A.C. Albuquerque, T.G.S. Cruz, F.M. Yamaji and F.L. Leite


Open access peer-reviewed

8. Predicting Macroscale Effects Through Nanoscale Features

By Victor J. Bellitto and Mikhail I. Melnik


Open access peer-reviewed

9. AFM Application in III-Nitride Materials and Devices

By Z. Chen, L.W. Su, J.Y. Shi, X.L. Wang, C.L. Tang and P. Gao


Open access peer-reviewed

10. Atomic Force Microscopy to Characterize the Healing Potential of Asphaltic Materials

By Prabir Kumar Das, Denis Jelagin, Björn Birgisson and Niki Kringos


Open access peer-reviewed

11. Atomic Force Microscopy – For Investigating Surface Treatment of Textile Fibers

By Nemeshwaree Behary and Anne Perwuelz


Edited Volume and chapters are indexed in

  • Worldcat
  • OpenAIRE
  • Google Scholar
  • AZ ebsco
  • Base
  • CNKI

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