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Multiple Material Property Characterization Using Induced Currents and Atomic Force Microscopy

Written By

Vijay Nalladega, Shamachary Sathish, Kumar V. Jata and Mark P. Blodgett

Submitted: May 12th, 2011 Published: April 27th, 2012

DOI: 10.5772/35594

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Written By

Vijay Nalladega, Shamachary Sathish, Kumar V. Jata and Mark P. Blodgett

Submitted: May 12th, 2011 Published: April 27th, 2012