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Estimation of Grain Boundary Sliding During Ambient-Temperature Creep in Hexagonal Close-Packed Metals Using Atomic Force Microscope

Written By

Tetsuya Matsunaga and Eiichi Sato

Submitted: 13 May 2011 Published: 27 April 2012

DOI: 10.5772/35640

From the Edited Volume

Scanning Probe Microscopy - Physical Property Characterization at Nanoscale

Edited by Vijay Nalladega

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Written By

Tetsuya Matsunaga and Eiichi Sato

Submitted: 13 May 2011 Published: 27 April 2012