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Characterization of Complex Spintronic and Superconducting Structures by Atomic Force Microscopy Techniques

Written By

L. Ciontea, M.S. Gabor, T. Petrisor Jr., T. Ristoiu, C. Tiusan and T. Petrisor

Submitted: 01 June 2011 Published: 27 April 2012

DOI: 10.5772/37302

From the Edited Volume

Scanning Probe Microscopy - Physical Property Characterization at Nanoscale

Edited by Vijay Nalladega

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Written By

L. Ciontea, M.S. Gabor, T. Petrisor Jr., T. Ristoiu, C. Tiusan and T. Petrisor

Submitted: 01 June 2011 Published: 27 April 2012