Open access peer-reviewed Edited Volume

Atomic Force Microscopy

Imaging, Measuring and Manipulating Surfaces at the Atomic Scale

Edited by Victor Bellitto

Naval Surface Warfare Center, United States of America

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.

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Atomic Force MicroscopyImaging, Measuring and Manipulating Surfaces at the Atomic ScaleEdited by Victor Bellitto

Published: March 23rd 2012

DOI: 10.5772/2673

ISBN: 978-953-51-0414-8

Copyright year: 2012

Books open for chapter submissions

50545 Total Chapter Downloads

12 Crossref Citations

37 Web of Science Citations

59 Dimensions Citations

chaptersDownloads

Open access peer-reviewed

1. Crystal Lattice Imaging Using Atomic Force Microscopy

By Vishal Gupta

5183

Open access peer-reviewed

2. Atomic Force Microscopy in Optical Imaging and Characterization

By Martin Veis and Roman Antos

2038

Open access peer-reviewed

3. Magnetic Force Microscopy: Basic Principles and Applications

By F.A. Ferri, M.A. Pereira-da-Silva and E. Marega Jr.

6518

Open access peer-reviewed

4. Vibration Responses of Atomic Force Microscope Cantilevers

By Thin-Lin Horng

2597

Open access peer-reviewed

5. Wavelet Transforms in Dynamic Atomic Force Spectroscopy

By Giovanna Malegori and Gabriele Ferrini

1866

Open access peer-reviewed

6. Nanoscale Effects of Friction, Adhesion and Electrical Conduction in AFM Experiments

By Marius Enachescu

2082

Open access peer-reviewed

7. Measurement of the Nanoscale Roughness by Atomic Force Microscopy: Basic Principles and Applications

By R.R.L. De Oliveira, D.A.C. Albuquerque, T.G.S. Cruz, F.M. Yamaji and F.L. Leite

19706

Open access peer-reviewed

8. Predicting Macroscale Effects Through Nanoscale Features

By Victor J. Bellitto and Mikhail I. Melnik

1582

Open access peer-reviewed

9. AFM Application in III-Nitride Materials and Devices

By Z. Chen, L.W. Su, J.Y. Shi, X.L. Wang, C.L. Tang and P. Gao

2926

Open access peer-reviewed

10. Atomic Force Microscopy to Characterize the Healing Potential of Asphaltic Materials

By Prabir Kumar Das, Denis Jelagin, Björn Birgisson and Niki Kringos

2286

Open access peer-reviewed

11. Atomic Force Microscopy – For Investigating Surface Treatment of Textile Fibers

By Nemeshwaree Behary and Anne Perwuelz

3761

Edited Volume and chapters are indexed in

  • Worldcat
  • OpenAIRE
  • Google Scholar
  • AZ ebsco
  • Base
  • CNKI
  • IET Inspec

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