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Measurement of the Nanoscale Roughness by Atomic Force Microscopy: Basic Principles and Applications

Written By

R.R.L. De Oliveira, D.A.C. Albuquerque, T.G.S. Cruz, F.M. Yamaji and F.L. Leite

Submitted: June 6th, 2011 Published: March 23rd, 2012

DOI: 10.5772/37583

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Written By

R.R.L. De Oliveira, D.A.C. Albuquerque, T.G.S. Cruz, F.M. Yamaji and F.L. Leite

Submitted: June 6th, 2011 Published: March 23rd, 2012