Open access peer-reviewed chapter

Atomic Force Microscopy in Optical Imaging and Characterization

By Martin Veis and Roman Antos

Submitted: May 12th 2011Reviewed: February 1st 2012Published: March 23rd 2012

DOI: 10.5772/35559

Downloaded: 2386

© 2012 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution 3.0 License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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Martin Veis and Roman Antos (March 23rd 2012). Atomic Force Microscopy in Optical Imaging and Characterization, Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale, Victor Bellitto, IntechOpen, DOI: 10.5772/35559. Available from:

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