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AFM Application in III-Nitride Materials and Devices

Written By

Z. Chen, L.W. Su, J.Y. Shi, X.L. Wang, C.L. Tang and P. Gao

Submitted: 03 June 2011 Published: 23 March 2012

DOI: 10.5772/37527

From the Edited Volume

Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale

Edited by Victor Bellitto

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Written By

Z. Chen, L.W. Su, J.Y. Shi, X.L. Wang, C.L. Tang and P. Gao

Submitted: 03 June 2011 Published: 23 March 2012