Open access peer-reviewed Edited Volume


Principles and Techniques for Materials Characterization

Edited by Faustino Wahaia

University of Porto

Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization.

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EllipsometryPrinciples and Techniques for Materials CharacterizationEdited by Faustino Wahaia

Published: November 29th 2017

DOI: 10.5772/65558

ISBN: 978-953-51-3624-8

Print ISBN: 978-953-51-3623-1

eBook (PDF) ISBN: 978-953-51-4592-9

Copyright year: 2017

Books open for chapter submissions

5164 Total Chapter Downloads

3 Crossref Citations

6 Web of Science Citations

5 Dimensions Citations


Open access peer-reviewed

1. Mie-Scattering Ellipsometry

By Yasuaki Hayashi and Akio Sanpei


Open access peer-reviewed

2. Achromatic Ellipsometry: Theory and Applications

By Eralci Moreira Therézio, Gustavo G. Dalkiranis, André A. Vieira, Hugo Gallardo, Ivan H. Bechtold, Patricia Targon Campana and Alexandre Marletta


Open access peer-reviewed

3. The Development of Three-Intensity Measurement in PSA Ellipsometry and Photoelastic Modulation Ellipsometry

By Yu-Faye Chao


Open access peer-reviewed

4. Multilayer Polarizer at the Energy of 50–1000 eV

By Jingtao Zhu and Mingqi Cui


Open access peer-reviewed

5. Spectroscopic Ellipsometry Study of Organic-Inorganic Halide: FAPbIxBr3−x Perovskite Thin Films by Two-Step Method

By Hajime Shirai


Open access peer-reviewed

6. Photoelastic Modulated Imaging Ellipsometry

By Chien-Yuan Han, Yu-Faye Chao and Hsiu-Ming Tsai


Open access peer-reviewed

7. Spectroscopic Ellipsometry - Application on the Classification of Diamond-Like Carbon Films

By XiaoLong Zhou and Hidetoshi Saitoh


Edited Volume and chapters are indexed in

  • Worldcat
  • OpenAIRE
  • Google Scholar
  • AZ ebsco
  • Base
  • CNKI

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