Open access peer-reviewed Edited Volume

Ellipsometry - Principles and Techniques for Materials Characterization

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Academic Editor

Faustino Wahaia
Faustino Wahaia

University of Porto

Published29 November 2017

Doi10.5772/65558

ISBN978-953-51-3624-8

Print ISBN978-953-51-3623-1

eBook (PDF) ISBN978-953-51-4592-9

Copyright year2017

Number of pages162

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Edited Volume and chapters are indexed in

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  • DOAB
  • Crossref
  • Dimension
  • OpenAIRE
  • AZ ebsco
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Table of Contents

Open access  chapters

1. Mie-Scattering Ellipsometry

By Yasuaki Hayashi and Akio Sanpei

1,319
3
2. Achromatic Ellipsometry: Theory and Applications

By Eralci Moreira Therézio, Gustavo G. Dalkiranis, André A. Vieira, Hugo Gallardo, Ivan H. Bechtold, Patricia Targon Campana and Alexandre Marletta

1,357
3
1,108
6. Photoelastic Modulated Imaging Ellipsometry

By Chien-Yuan Han, Yu-Faye Chao and Hsiu-Ming Tsai

1,809

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9,793 Total Chapter Downloads

1,488 Total Chapter Views

11 Crossref Citations

7 Web of Science Citations

15 Dimensions Citations

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