Open access peer-reviewed Edited Volume

Ellipsometry - Principles and Techniques for Materials Characterization

Book metrics overview

8,305 Chapter Downloads

View Full Metrics

Academic Editor

Faustino Wahaia

University of Porto

PublishedNovember 29th, 2017

Doi10.5772/65558

ISBN978-953-51-3624-8

Print ISBN978-953-51-3623-1

eBook (PDF) ISBN978-953-51-4592-9

Copyright year2017

Number of pages162

Read more
Order Print Copy

Edited Volume and chapters are indexed in

  • Google Scholar
  • DOAB
  • Crossref
  • Dimension
  • OpenAIRE
  • AZ ebsco
  • Worldcat
Show more

Table of Contents

Open access  chapters

1. Mie-Scattering Ellipsometry

By Yasuaki Hayashi and Akio Sanpei

1,123
3
2. Achromatic Ellipsometry: Theory and Applications

By Eralci Moreira Therézio, Gustavo G. Dalkiranis, André A. Vieira, Hugo Gallardo, Ivan H. Bechtold, Patricia Targon Campana and Alexandre Marletta

1,127
1
953
6. Photoelastic Modulated Imaging Ellipsometry

By Chien-Yuan Han, Yu-Faye Chao and Hsiu-Ming Tsai

1,520

IMPACT OF THIS BOOK AND ITS CHAPTERS

8,305 Total Chapter Downloads

7 Crossref Citations

7 Web of Science Citations

10 Dimensions Citations

Order a print copy of this book

£119 (ex. VAT)*

Hardcover | Printed Full Colour

IntechOpen Contributor? Get your Discount

FREE SHIPPING WORLDWIDE

Order & Delivery info

* Residents of European Union countries need to add a Book Value-Added Tax Rate based on their country of residence. Institutions and companies, registered as VAT taxable entities in their own EU member state, will not pay VAT by providing IntechOpen with their VAT registration number. This is made possible by the EU reverse charge method.

Instructor? Request an Exam Copy