Open access peer-reviewed Edited volume

X-Ray Spectroscopy

Edited by Shatendra K Sharma

Jawaharlal Nehru University, India

The x-ray is the only invention that became a regular diagnostic tool in hospitals within a week of its first observation by Roentgen in 1895. Even today, x-rays are a great characterization tool at the hands of scientists working in almost every field, such as medicine, physics, material science, space science, chemistry, archeology, and metallurgy. With vast existing applications of x-rays, it is even more surprising that every day people are finding new applications of x-rays or refining the existing techniques. This book consists of selected chapters on the recent applications of x-ray spectroscopy that are of great interest to the scientists and engineers working in the fields of material science, physics, chemistry, astrophysics, astrochemistry, instrumentation, and techniques of x-ray based characterization. The chapters have been grouped into two major sections based upon the techniques and applications. The book covers some basic principles of satellite x-rays as characterization tools for chemical properties and the physics of detectors and x-ray spectrometer. The techniques like EDXRF, WDXRF, EPMA, satellites, micro-beam analysis, particle induced XRF, and matrix effects are discussed. The characterization of thin films and ceramic materials using x-rays is also covered.

Read more >Order hardcopy
IntechOpen
X-Ray SpectroscopyEdited by Shatendra K Sharma

Published: February 1st 2012

DOI: 10.5772/1422

ISBN: 978-953-307-967-7

Books open for chapter submissions

39596 Total Chapter Downloads

3 Crossref Citations

17 Web of Science Citations

14 Dimensions Citations

chaptersDownloads

Open access peer-reviewed

1. X-Ray Spectroscopy Tools for the Characterization of Nanoparticles

By Murid Hussain, Guido Saracco and Nunzio Russo

2491

Open access peer-reviewed

2. A Practical Application of X-Ray Spectroscopy in Ti-Al-N and Cr-Al-N Thin Films

By Leonid Ipaz, William Aperador, Julio Caicedo, Joan Esteve and Gustavo Zambrano

2073

Open access peer-reviewed

3. High Resolution X-Ray Spectroscopy with Compound Semiconductor Detectors and Digital Pulse Processing Systems

By Leonardo Abbene and Gaetano Gerardi

3752

Open access peer-reviewed

4. Analysis of the K Satellite Lines in X-Ray Emission Spectra

By M. Torres Deluigi and J. Díaz-Luque

1951

Open access peer-reviewed

5. Application of Wavelength Dispersive X-Ray Spectroscopy in X-Ray Trace Element Analytical Techniques

By Matjaž Kavčič

4113

Open access peer-reviewed

6. The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science

By Frédéric Christien, Edouard Ferchaud, Pawel Nowakowski and Marion Allart

3572

Open access peer-reviewed

7. Chemical Quantification of Mo-S, W-Si and Ti-V by Energy Dispersive X-Ray Spectroscopy

By Carlos Angeles-Chavez, Jose Antonio Toledo-Antonio and Maria Antonia Cortes-Jacome

2432

Open access peer-reviewed

8. Quantification in X-Ray Fluorescence Spectrometry

By Rafał Sitko and Beata Zawisza

8793

Open access peer-reviewed

9. The Interaction of High Brightness X-Rays with Clusters or Bio-Molecules

By Kengo Moribayashi

1339

Open access peer-reviewed

10. Employing Soft X-Rays in Experimental Astrochemistry

By Sergio Pilling and Diana P. P. Andrade

1563

Open access peer-reviewed

11. X-Ray Analysis on Ceramic Materials Deposited by Sputtering and Reactive Sputtering for Sensing Applications

By Rossana Gazia, Angelica Chiodoni, Edvige Celasco, Stefano Bianco and Pietro Mandracci

3120

Open access peer-reviewed

12. Application of Stopped-Flow and Time-Resolved X-Ray Absorption Spectroscopy to the Study of Metalloproteins Molecular Mechanisms

By Moran Grossman and Irit Sagi

1966

Open access peer-reviewed

13. Nanoscale Chemical Analysis in Various Interfaces with Energy Dispersive X-Ray Spectroscopy and Transmission Electron Microscopy

By Seiichiro Ii

2431

Edited volume and chapters are indexed in

  • Worldcat
  • OpenAIRE
  • Google Scholar
  • AZ ebsco
  • Base
  • CNKI
  • IET Inspec

Order a hardcopy of the Edited volume

Free shipping with DHL Express

Hardcover (ex. VAT)£140

Order now

Residents of European Union countries need to add a Book Value-Added Tax of 5%. Institutions and companies, registered as VAT taxable entities in their own EU member state, will not pay VAT by providing IntechOpen with their VAT registration number. This is made possible by the EU reverse charge method.

Special discount for IntechOpen contributors

All IntechOpen contributors are offered special discounts starting at 40% OFF available through your personal dashboard

Login and purchase