Open access peer-reviewed Edited Volume

Atomic-force Microscopy and Its Applications

Edited by Tomasz Tański

Silesian University of Technology

Co-editors:

Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. The chapters for this book have been written by respected and well-known researchers and specialists from different countries. We hope that after studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation.

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IntechOpen
Atomic-force Microscopy and Its ApplicationsEdited by Tomasz Tański

Published: January 30th 2019

DOI: 10.5772/intechopen.74139

ISBN: 978-1-78985-170-0

Print ISBN: 978-1-78985-169-4

Copyright year: 2019

Books open for chapter submissions

639 Total Chapter Downloads

chaptersDownloads

Open access peer-reviewed

1. Introductory Chapter: Why Atomic Force Microscopy (AFM) is One of the Leading Methods of Surface Morphology Research of all Engineering Material Groups

By Tomasz Tański, Bogusław Ziębowicz, Paweł Jarka and Marcin Staszuk

89

Open access peer-reviewed

2. Characterization of Single Polymer Molecules

By Milad Radiom

101

Open access peer-reviewed

3. Forensic Potential of Atomic Force Microscopy with Special Focus on Age Determination of Bloodstains

By Threes Smijs and Federica Galli

170

Open access peer-reviewed

4. Scanning Probe Techniques for Characterization of Vertically Aligned Carbon Nanotubes

By Marina V. Il’ina, Oleg I. Il’in, Vladimir A. Smirnov, Yuriy F. Blinov, Boris G. Konoplev and Oleg A. Ageev

104

Open access peer-reviewed

5. Characterization of Multiblock (Segmented) Copolyurethane- Imides and Nanocomposites Based Thereof Using AFM, Nanotribology, and Nanoindentation Methods

By Tatiana Evgenievna Sukhanova, Tatyana A. Kuznetsova, Vasilina A. Lapitskaya, Tatiana I. Zubar, Sergei A. Chizhik, Milana E. Vylegzhanina, Aleksandr A. Kutin, Andrey L. Didenko and Valentin M. Svetlichnyi

77

Open access peer-reviewed

6. High-Magnification SEM Micrograph of Siloxanes

By Arzu Erol

98

Edited Volume and chapters are indexed in

  • Worldcat
  • OpenAIRE
  • Google Scholar
  • AZ ebsco
  • Base
  • CNKI
  • IET Inspec

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