Open access peer-reviewed Edited Volume

Atomic-force Microscopy and Its Applications

Edited by Tomasz Arkadiusz Tański

Silesian University of Technology


Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. The chapters for this book have been written by respected and well-known researchers and specialists from different countries. We hope that after studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation.

Read more >Order hardcopy
Atomic-force Microscopy and Its ApplicationsEdited by Tomasz Arkadiusz Tański

Published: January 30th 2019

DOI: 10.5772/intechopen.74139

ISBN: 978-1-78985-170-0

Print ISBN: 978-1-78985-169-4

eBook (PDF) ISBN: 978-1-83881-776-3

Copyright year: 2019

Books open for chapter submissions

5912 Total Chapter Downloads

6 Crossref Citations

4 Web of Science Citations

11 Dimensions Citations


Open access peer-reviewed

1. Introductory Chapter: Why Atomic Force Microscopy (AFM) is One of the Leading Methods of Surface Morphology Research of all Engineering Material Groups

By Tomasz Tański, Bogusław Ziębowicz, Paweł Jarka and Marcin Staszuk


Open access peer-reviewed

2. Characterization of Single Polymer Molecules

By Milad Radiom


Open access peer-reviewed

3. Forensic Potential of Atomic Force Microscopy with Special Focus on Age Determination of Bloodstains

By Threes Smijs and Federica Galli


Open access peer-reviewed

4. Scanning Probe Techniques for Characterization of Vertically Aligned Carbon Nanotubes

By Marina V. Il’ina, Oleg I. Il’in, Vladimir A. Smirnov, Yuriy F. Blinov, Boris G. Konoplev and Oleg A. Ageev


Open access peer-reviewed

5. Characterization of Multiblock (Segmented) Copolyurethane- Imides and Nanocomposites Based Thereof Using AFM, Nanotribology, and Nanoindentation Methods

By Tatiana Evgenievna Sukhanova, Tatyana A. Kuznetsova, Vasilina A. Lapitskaya, Tatiana I. Zubar, Sergei A. Chizhik, Milana E. Vylegzhanina, Aleksandr A. Kutin, Andrey L. Didenko and Valentin M. Svetlichnyi


Open access peer-reviewed

6. High-Magnification SEM Micrograph of Siloxanes

By Arzu Erol


Edited Volume and chapters are indexed in

  • Worldcat
  • OpenAIRE
  • Google Scholar
  • AZ ebsco
  • Base
  • CNKI

Order a hardcopy of the Edited Volume

Free shipping with DHL Express

Hardcover (ex. VAT)£119

Order now

Residents of European Union countries need to add a Book Value-Added Tax Rate based on their country of residence. Institutions and companies, registered as VAT taxable entities in their own EU member state, will not pay VAT by providing IntechOpen with their VAT registration number. This is made possible by the EU reverse charge method.

Special discount for IntechOpen contributors

All IntechOpen contributors are offered special discounts starting at 40% OFF available through your personal dashboard

Login and purchase

Related books