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Implications of Negative Bias Temperature Instability in Power MOS Transistors

Written By

Danijel Danković, Ivica Manić, Snežana Djorić-Veljković, Vojkan Davidović, Snežana Golubović and Ninoslav Stojadinović

Published: December 1st, 2009

DOI: 10.5772/7018

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Written By

Danijel Danković, Ivica Manić, Snežana Djorić-Veljković, Vojkan Davidović, Snežana Golubović and Ninoslav Stojadinović

Published: December 1st, 2009