Mohamed Kheir was born in Cairo, Egypt, in 1977. He received his MSc degree in Communications Technology from the University of Ulm, Ulm, Germany in 2005, and his PhD degree (with honors) in Information Engineering and Technology from the German University in Cairo, Egypt, in collaboration with Magdeburg University, Germany, in 2011. From 2012 to 2015, he was a Lecturer at the Chair of Microwave Engineering, University of Kiel, Germany, where he was involved in several research projects and teaching duties. From October 2015 to October 2019, he has been a Senior RF-Development Engineer with IMS Connector Systems Group, Germany, where he is responsible for the design and development of high-speed and multi-channel connectors for automotive and 5G applications. Since November 2019, he has been working as a Senior EMC Expert at Keysight Technologies, Germany. His research interests include microwave/mm wave integrated circuits, EMC measurements, and UWB Technology. Dr. Kheir serves as an Associate Editor at IEEE Access and IEEE Internet of Things Journal. He is also a reviewer for multiple IEEE/IET journals and a TPC-member for many conferences. Dr. Kheir is the recipient of several prestigious awards and honors from different conferences and organizations worldwide.