In this chapter, we highlighted the in situ transmission electron microscope (TEM) observation of the interactions of dislocations with three types of interfaces: (i) twin boundaries in Cu; (ii) metallic interphase boundaries; and (iii) metal/ceramic interfaces. Interface structures, interface properties, and dislocation-interface interactions are characterized in a high-resolution TEM. These knowledge provided insights into the understanding of the physical properties of materials, developing materials modeling tools incorporating interface deformation physics, and designing materials with desired properties.
Part of the book: The Transmission Electron Microscope