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Transmission Electron Microscopy to Study Gallium Nitride Transistors Grown on Sapphire and Silicon Substrates

Written By

S. Lawrence Selvaraj and Takashi Egawa

Submitted: May 17th, 2011 Published: April 4th, 2012

DOI: 10.5772/35876

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Written By

S. Lawrence Selvaraj and Takashi Egawa

Submitted: May 17th, 2011 Published: April 4th, 2012