Open access

Pattern Recognition based Fault Diagnosis in Industrial Processes: Review and Application

Written By

Thomas W. Rauber, Eduardo Mendel do Nascimento, Estefhan D. Wandekokem and Flavio M. Varejao

Published: 01 February 2010

DOI: 10.5772/9365

From the Edited Volume

Pattern Recognition Recent Advances

Edited by Adam Herout

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Written By

Thomas W. Rauber, Eduardo Mendel do Nascimento, Estefhan D. Wandekokem and Flavio M. Varejao

Published: 01 February 2010