Open access peer-reviewed chapter

Low Frequency Noise as a Tool for OCDs Reliability Screening

By Qiuzhan Zhou, Jian Gao and Dan’e Wu

Submitted: November 28th 2010Reviewed: May 18th 2011Published: October 5th 2011

DOI: 10.5772/23593

Downloaded: 1547

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Qiuzhan Zhou, Jian Gao and Dan’e Wu (October 5th 2011). Low Frequency Noise as a Tool for OCDs Reliability Screening, Optoelectronics - Devices and Applications, Padmanabhan Predeep, IntechOpen, DOI: 10.5772/23593. Available from:

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