Open access peer-reviewed chapter

Measurement of High-Frequency Characteristics of CNTFETs and Equivalent Circuit Model Analysis

By Kaoru Narita

Published: March 1st 2010

DOI: 10.5772/39428

Downloaded: 4157

© 2010 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution-NonCommercial-ShareAlike-3.0 License, which permits use, distribution and reproduction for non-commercial purposes, provided the original is properly cited and derivative works building on this content are distributed under the same license.

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Kaoru Narita (March 1st 2010). Measurement of High-Frequency Characteristics of CNTFETs and Equivalent Circuit Model Analysis, Carbon Nanotubes, Jose Mauricio Marulanda, IntechOpen, DOI: 10.5772/39428. Available from:

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