Open access peer-reviewed chapter

Lifetime Yield Optimization of Analog Circuits Considering Process Variations and Parameter Degradations

By Xin Pan and Helmut Graeb

Submitted: May 21st 2010Reviewed: September 16th 2010Published: February 2nd 2011

DOI: 10.5772/14322

Downloaded: 2268

© 2011 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution-NonCommercial-ShareAlike-3.0 License, which permits use, distribution and reproduction for non-commercial purposes, provided the original is properly cited and derivative works building on this content are distributed under the same license.

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Xin Pan and Helmut Graeb (February 2nd 2011). Lifetime Yield Optimization of Analog Circuits Considering Process Variations and Parameter Degradations, Advances in Analog Circuits, Esteban Tlelo-Cuautle, IntechOpen, DOI: 10.5772/14322. Available from:

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