Open access peer-reviewed Edited Volume

Advances in Analog Circuits

Book metrics overview

46,146 Chapter Downloads

View Full Metrics

Academic Editor

Esteban Tlelo-Cuautle

National Institute of Astrophysics, Optics and Electronics, Mexico

PublishedFebruary 2nd, 2011

Doi10.5772/607

ISBN978-953-307-323-1

eBook (PDF) ISBN978-953-51-5982-7

Copyright year2011

Number of pages382

Read more
Order Print Copy

Edited Volume and chapters are indexed in

  • World Of Science
  • BKCI
  • Google Scholar
  • DOAB
  • Crossref
  • Dimension
  • OpenAIRE
  • AZ ebsco
Show more

Table of Contents

Open access peer-reviewed  chapters

4. Behavioral Modeling of Mixed-Mode Integrated Circuits

By Esteban Tlelo-Cuautle, Elyoenai Martínez-Romero, Carlos Sánchez-López, Francisco V. Fernández, Sheldon X.-D. Tan, Peng Li and Mourad Fakhfakh

2,876
1
5,146
3
9. Tunable Analog and Reconfigurable Digital Circuits with Nanoscale DG-MOSFETs

By Savas Kaya, Hesham F. A. Hamed and Soumyasanta Laha

3,014
1
11. Advanced Statistical Methodologies for Tolerance Analysis in Analog Circuit Design

By Bruno Apolloni, Simone Bassis, Angelo Ciccazzo, Angelo Marotta, Salvatore Rinaudo and Orazio Muscato

1,873
16. Evolvable Metaheuristics on Circuit Design

By Felipe Padilla, Aurora Torres, Julio Ponce, María Dolores Torres, Sylvie Ratté and Eunice Ponce-de-León

2,218
4

IMPACT OF THIS BOOK AND ITS CHAPTERS

46,146 Total Chapter Downloads

27 Crossref Citations

42 Web of Science Citations

34 Dimensions Citations

Order a print copy of this book

£139 (ex. VAT)*

Hardcover | Printed Full Colour

IntechOpen Contributor? Get your Discount

FREE SHIPPING WORLDWIDE

Order & Delivery info

* Residents of European Union countries need to add a Book Value-Added Tax Rate based on their country of residence. Institutions and companies, registered as VAT taxable entities in their own EU member state, will not pay VAT by providing IntechOpen with their VAT registration number. This is made possible by the EU reverse charge method.

Instructor? Request an Exam Copy