Dahi Ibrahim

National Institute of Standards

Dahi Ghareab Abdelsalam Ibrahim received his BS and MS in physics from Minia University, Minia, Arab Republic of Egypt, in 1997 and 2001, respectively, and his PhD in optics from the University of Al-Azhar, Cairo, Egypt, joint with PTB, Germany, in 2009. His PhD work was on design and characteristics of a multiple-beam reflected system and its applications in surface micro-topography measurement. He worked for two years as a postdoctoral scientist at the Optical metrology laboratory of the Mechanical System Engineering, University of Chonbuk, Jeonju, South Korea, where he continued his research on optical metrology. In 2012 to 2013, he worked as a postdoctoral scientist for camera calibration at Mechanical Engineering Department, University of Lille, Lille, France. He joined the Department of Physics at the University of Tokushima, Tokushima, Japan, as a designated researcher in the field of optical frequency comb and terahertz technology from 2014 to 2016. Then he joined the Optholomology Departement, Ohio State University, to continue the work of optical metrology for six months. In 2017, he worked again for one year as a research professor at the Optical metrology laboratory of the Mechanical System Engineering, University of Chonbuk, Jeonju, South Korea, where he worked on optical metrology with PolarCam. He visited the Xi’an institute of optics, China two times for two months and worked with parallel phase shifting. He is now working at the Engineering and surface metrology laboratory, National Institute of Standards (NIS), Egypt. In the early years his research was focused on multiple-beam interferometry for surface metrology. In recent years his interest has shifted to digital holographic microscopy, terahertz imaging, optical frequency comb, and super-resolution microscopy and their applications in medicine. Combining his expertise on interferometry and polarimetery, he invented a highly sensitive interferometric imaging technique.

2chapters authored