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Robust Design and Test of Analog/Mixed-Signal Circuits in Deeply Scaled CMOS Technologies

Written By

Guo Yu and Peng Li

Published: February 1st, 2010

DOI: 10.5772/8256

From the Edited Volume

VLSI

Edited by Zhongfeng Wang

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Written By

Guo Yu and Peng Li

Published: February 1st, 2010