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High-Resolution Near-Field Optical Microscopy: A Sub-10 Nanometer Probe for Surface Electromagnetic Field and Local Dielectric Trait

Written By

Jen-You Chu and Juen-Kai Wang

Submitted: February 18th, 2011 Published: March 21st, 2012

DOI: 10.5772/27458

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Written By

Jen-You Chu and Juen-Kai Wang

Submitted: February 18th, 2011 Published: March 21st, 2012