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XAFS Measurement System in the Soft X-ray Region for Various Sample Conditions and Multipurpose Measurements

Written By

Koji Nakanishi and Toshiaki Ohta

Submitted: 02 June 2011 Published: 07 March 2012

DOI: 10.5772/37395

From the Edited Volume

Advanced Topics in Measurements

Edited by Md. Zahurul Haq

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Written By

Koji Nakanishi and Toshiaki Ohta

Submitted: 02 June 2011 Published: 07 March 2012