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In-Situ Supply-Noise Measurement in LSIs with Millivolt Accuracy and Nanosecond-Order Time Resolution

Written By

Yusuke Kanno

Published: 23 November 2011

DOI: 10.5772/27833

From the Edited Volume

Applications of Digital Signal Processing

Edited by Christian Cuadrado-Laborde

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Written By

Yusuke Kanno

Published: 23 November 2011