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Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy

Written By

Elad Koren, Jonathan E. Allen, Uri Givan, Noel Berkovitch, Eric R. Hemesath, Lincoln J. Lauhon and Yossi Rosenwaks

Submitted: November 3rd, 2010 Published: July 18th, 2011

DOI: 10.5772/19333

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Written By

Elad Koren, Jonathan E. Allen, Uri Givan, Noel Berkovitch, Eric R. Hemesath, Lincoln J. Lauhon and Yossi Rosenwaks

Submitted: November 3rd, 2010 Published: July 18th, 2011