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In-Situ Analysis of Optoelectronic Properties of Semiconductor Nanostructures and Defects in Transmission Electron Microscopes

Written By

Yutaka Ohno, Ichiro Yonenega and Seiji Takeda

Submitted: 31 May 2010 Published: 19 April 2011

DOI: 10.5772/14813

From the Edited Volume

Optoelectronic Devices and Properties

Edited by Oleg Sergiyenko

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Written By

Yutaka Ohno, Ichiro Yonenega and Seiji Takeda

Submitted: 31 May 2010 Published: 19 April 2011