Open access peer-reviewed chapter

Studies on Electrical and Retention Enhancement Properties of Metal-Ferroelectric-Insulator-Semiconductor with Radical Irradiation Treatments

By Le Van Hai, Takeshi Kanashima and Masanori Okuyama

Submitted: October 19th 2010Reviewed: April 18th 2011Published: August 24th 2011

DOI: 10.5772/17106

Downloaded: 1741

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Le Van Hai, Takeshi Kanashima and Masanori Okuyama (August 24th 2011). Studies on Electrical and Retention Enhancement Properties of Metal-Ferroelectric-Insulator-Semiconductor with Radical Irradiation Treatments, Ferroelectrics - Material Aspects, Mickaël Lallart, IntechOpen, DOI: 10.5772/17106. Available from:

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