Scanning Probe Microscopy-Physical Property Characterization at Nanoscale,  ISBN: 978-953-51-0576-3

Multiple Material Property Characterization Using Induced Currents and Atomic Force Microscopy

By Vijay Nalladega, Shamachary Sathish, Kumar V. Jata and Mark P. Blodgett

DOI: 10.5772/35594



Submission date: 25. October, 2011.
Published online: 27. April, 2012.
Published in print edition: April, 2012.


Fig. 1. Accumulated download share in the last six months. The time period is defined from the publication date up to today.



Fig. 2. Number of chapter downloads in the last six months by country. The countries represented are the TOP 5 countries from which this paper was accessed.



Fig. 3. Pie chart shows the download share by country. The countries represented are the TOP 5 countries from which this paper was accessed.



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Europe1
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Jordan1
Sri Lanka1
Unknown450