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Scanning Probe Microscopy-Physical Property Characterization at Nanoscale,  ISBN: 978-953-51-0576-3

Multiple Material Property Characterization Using Induced Currents and Atomic Force Microscopy

By Vijay Nalladega, Shamachary Sathish, Kumar V. Jata and Mark P. Blodgett

DOI: 10.5772/35594



Submission date: 25. October, 2011.
Published online: 27. April, 2012.
Published in print edition: April, 2012.


Fig. 1. Accumulated download share in the last six months. The time period is defined from the publication date up to today.



Fig. 2. Number of chapter downloads in the last six months by country. The countries represented are the TOP 5 countries from which this paper was accessed.



Fig. 3. Pie chart shows the download share by country. The countries represented are the TOP 5 countries from which this paper was accessed.



Downloads per country


CountryDownloads
Iran, Islamic Republic of646
United States of America513
China157
India96
United Kingdom65
Germany65
Mexico45
Canada39
Japan31
Russian Federation31
Brazil29
Vietnam28
Romania27
Korea, Republic of27
Saudi Arabia26
Asia/Pacific Region25
Italy25
France25
Taiwan24
Australia21
Egypt19
Spain19
Turkey16
Poland14
Greece13
Algeria12
Belgium12
Indonesia11
Netherlands10
Argentina10
Ukraine10
Croatia9
Malaysia8
Portugal8
Austria8
Thailand7
Philippines7
Morocco7
Latvia6
Hong Kong6
Syrian Arab Republic6
Iraq6
Hungary5
Serbia5
Uruguay4
South Africa4
Colombia4
Pakistan4
Kenya4
Czech Republic4
Venezuela4
Singapore3
Lithuania3
Norway3
Bosnia and Herzegovina3
Nigeria3
Slovakia3
Denmark3
Chile3
Sweden3
Oman3
Dominican Republic2
Malta2
United Arab Emirates2
Finland2
Ethiopia2
Slovenia2
Peru2
Belarus2
Israel2
Bangladesh2
Togo1
Cuba1
Jordan1
Switzerland1
Madagascar1
Macedonia1
Sri Lanka1
Uganda1
Guatemala1
Lebanon1
Antigua and Barbuda1
Europe1
Albania1
El Salvador1
Unknown494