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Scanning Probe Microscopy-Physical Property Characterization at Nanoscale,  ISBN: 978-953-51-0576-3

Multiple Material Property Characterization Using Induced Currents and Atomic Force Microscopy

By Vijay Nalladega, Shamachary Sathish, Kumar V. Jata and Mark P. Blodgett

DOI: 10.5772/35594



Submission date: 25. October, 2011.
Published online: 27. April, 2012.
Published in print edition: April, 2012.


Fig. 1. Accumulated download share in the last six months. The time period is defined from the publication date up to today.



Fig. 2. Number of chapter downloads in the last six months by country. The countries represented are the TOP 5 countries from which this paper was accessed.



Fig. 3. Pie chart shows the download share by country. The countries represented are the TOP 5 countries from which this paper was accessed.



Downloads per country


CountryDownloads
Iran, Islamic Republic of646
United States of America567
China176
India96
United Kingdom66
Germany66
Mexico46
Canada40
Russian Federation34
Brazil31
Japan31
France29
Vietnam28
Romania27
Korea, Republic of27
Saudi Arabia26
Asia/Pacific Region25
Italy25
Taiwan24
Australia22
Spain20
Egypt19
Turkey17
Poland14
Belgium13
Greece13
Algeria13
Indonesia11
Ukraine11
Netherlands10
Argentina10
Croatia9
Portugal8
Malaysia8
Austria8
Thailand7
Morocco7
Philippines7
Iraq7
Syrian Arab Republic6
Hong Kong6
Latvia6
Hungary5
Serbia5
Colombia5
Uruguay4
South Africa4
Pakistan4
Kenya4
Czech Republic4
Venezuela4
Lithuania3
Chile3
Norway3
Oman3
Bosnia and Herzegovina3
Nigeria3
Slovakia3
Singapore3
Sweden3
Denmark3
Peru2
Belarus2
United Arab Emirates2
Bangladesh2
Malta2
Israel2
Slovenia2
Finland2
Ethiopia2
Dominican Republic2
Togo1
Albania1
Switzerland1
Madagascar1
Cuba1
Macedonia1
Jordan1
Guatemala1
Europe1
Antigua and Barbuda1
El Salvador1
Sri Lanka1
Uganda1
Lebanon1
Unknown495