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Scanning Probe Microscopy-Physical Property Characterization at Nanoscale,  ISBN: 978-953-51-0576-3

Multiple Material Property Characterization Using Induced Currents and Atomic Force Microscopy

By Vijay Nalladega, Shamachary Sathish, Kumar V. Jata and Mark P. Blodgett

DOI: 10.5772/35594



Submission date: 25. October, 2011.
Published online: 27. April, 2012.
Published in print edition: April, 2012.


Fig. 1. Accumulated download share in the last six months. The time period is defined from the publication date up to today.



Fig. 2. Number of chapter downloads in the last six months by country. The countries represented are the TOP 5 countries from which this paper was accessed.



Fig. 3. Pie chart shows the download share by country. The countries represented are the TOP 5 countries from which this paper was accessed.



Downloads per country


CountryDownloads
Iran, Islamic Republic of646
United States of America556
China174
India96
United Kingdom66
Germany66
Mexico46
Canada40
Russian Federation33
Brazil31
Japan31
France28
Vietnam28
Romania27
Korea, Republic of27
Saudi Arabia26
Italy25
Asia/Pacific Region25
Taiwan24
Australia22
Spain20
Egypt19
Turkey17
Poland14
Belgium13
Greece13
Algeria13
Indonesia11
Ukraine11
Argentina10
Netherlands10
Croatia9
Malaysia8
Austria8
Portugal8
Philippines7
Morocco7
Thailand7
Hong Kong6
Syrian Arab Republic6
Iraq6
Latvia6
Hungary5
Serbia5
Colombia5
Uruguay4
South Africa4
Pakistan4
Kenya4
Czech Republic4
Venezuela4
Oman3
Lithuania3
Norway3
Singapore3
Bosnia and Herzegovina3
Nigeria3
Slovakia3
Sweden3
Denmark3
Chile3
Malta2
Slovenia2
Finland2
Ethiopia2
Peru2
Belarus2
Dominican Republic2
Israel2
United Arab Emirates2
Bangladesh2
Switzerland1
Madagascar1
Cuba1
Macedonia1
Jordan1
Guatemala1
Europe1
Sri Lanka1
Uganda1
Lebanon1
Antigua and Barbuda1
El Salvador1
Albania1
Togo1
Unknown495