Chemistry » Electrochemistry » "Scanning Probe Microscopy-Physical Property Characterization at Nanoscale", book edited by Vijay Nalladega, ISBN 978-953-51-0576-3, Published: April 27, 2012 under CC BY 3.0 license. © The Author(s).
Characterization of Complex Spintronic and Superconducting Structures by Atomic Force Microscopy Techniques
By L. Ciontea, M.S. Gabor, T. Petrisor Jr., T. Ristoiu, C. Tiusan and T. Petrisor