Physics » Optics and Lasers

Optical Interferometry

Edited by Alexander A. Banishev, Mithun Bhowmick and Jue Wang, ISBN 978-953-51-2956-1, Print ISBN 978-953-51-2955-4, 258 pages, Publisher: InTech, Chapters published February 15, 2017 under CC BY 3.0 license
DOI: 10.5772/63683
Edited Volume

Optical methods of measurements are the most sensitive techniques of noncontact investigations, and at the same time, they are fast as well as accurate which increases reproducibility of observed results. In recent years, the importance of optical interferometry methods for research has dramatically increased, and applications range from precise surface testing to finding extrasolar planets. This book covers various aspects of optical interferometry including descriptions of novel apparatuses and methods, application interferometry for studying biological objects, surface qualities, materials characterization, and optical testing. The book includes a series of chapters in which experts share recent progress in interferometry through original research and literature reviews.

Dr. Alexandr Banishev

University of Illinois at Urbana-Champaign, United States of America

Dr. Alexander Banishev is a research associate at the University of Illinois, Urbana-Champaign (USA). He received PhD degree in Physics at Lomonosov Moscow State University (Russia) in 2008. Before join to the University of Illinois, he was working at the University of California, Riverside. His primary research interests include optical and laser physic, light interaction with nano- and molecular materials, optical properties of materials under extreme conditions and precise measurements. He reviews articles for Optical Society of America journals.

Education

  • 2005 - 2008

    Physics, Lomonosov Moscow State University, Moscow

    Quantum Electronics

Edited Books

  • Optical Interferometry

    Optical methods of measurements are the most sensitive techniques of noncontact investigations, and at the same time, they are fast as well as accurate which increases reproducibility of observed results. In recent years, the importance of optical interferometry methods for research has dramatically increased, and applications range from precise surface testing to finding extrasolar planets. This book covers various aspects of optical interferometry including descriptions of novel apparatuses and methods, application interferometry for studying biological objects, surface qualities, materials characterization, and optical testing. The book includes a series of chapters in which experts share recent progress in interferometry through original research and literature reviews.

INTECHOPEN PUBLICATIONS

Dr. Jue Wang

Dr. Jue Wang is a research associate at the University of Illinois, Urbana-Champaign, USA. He received PhD degree in Geosciences at Princeton University in 2014. Before join to the University of Illinois, he was studying equation of state and structure of materials at high pressures and high temperatures at Princeton University. His research interests include physical and chemical property of materials at extreme conditions. He reviews articles for Scientific Reports and Optics Letters.

Dr. Mithun Bhowmick

Dr. Mithun Bhowmick completed his PhD in Physics from Virginia Tech in 2012 and currently is working as a research associate at University of Illinois, Urbana-Champaign (UIUC). Before Joining UIUC, he has worked at Nazarbayev University and Universidad National Autonomous University of Mexico as full time and visiting professors, respectively. His research interests are Optical Properties of Semiconductors, Many body effects in scattering mechanisms of carriers/spins, and Energetic liquids under extreme conditions. He is recipient of Jamie Dunn award, Philip Morris Fellowship, and Ministry of Education and Science grant from Republic of Kazakhstan for his studies on semiconductor hetero-structures. He is a member of American Physical Society, Optical Society of America, and reviews articles for international journals on Materials Science/Applied Physics (Physical Review B, Journal of Applied Physics etc.).