About the book
Atomic force microscopy (AFM) has become well established as well as a widely accepted technique used in air, liquids, or vacuum to generate high-resolution topographic images of a surface having a nanometer-scale resolution. It is widely used in collecting valuable data in all areas: physics, chemistry, materials science, nanoscience and nanotechnology, and biotechnology, etc. AFM is generally operated in contact mode, tapping mode and the introduction of new advanced imaging modes has expanded applications of AFM such as electrical, magnetic, or mechanical properties at the nanoscale. AFM has a group of techniques used for non-destructive surface studies at the nanoscale. In addition, samples scanned by AFM require no special treatment and provides a three-dimensional surface profile.
This book intends to provide the reader with a comprehensive overview of the basic fundamentals of AFM, new results, and many applications in different areas where AFM has become a vital characterization technique. The book will be useful to a wide range of readers.