Open access peer-reviewed Edited Volume

Atomic Force Microscopy - Basic Principles to Advanced Applications

Chandra Shakher Pathak

Ben-Gurion University of the Negev

Dr. Pathak is an experimental physicist with expertise in AFM and electronic devices.


Samir Kumar

Kyoto University

Dr. Kumar received his Ph.D. in physics from the Indian Institute of Technology Delhi (IITD) and is currently with Kyoto University since Feb 2018 working on the development of a gel baser SERS biosensor and study of nanocavity sensor among other activities.

Pawan Kumar

LMN Institute of Information Technology Jaipur

Dr. Sharma works at the LMN Institute of Information Technology Jaipur and has research experience in material science, nanotechnology, and organic solar cells.


Contact Mode Roughness AFM Probe Topography Resolution Nanoscale Characterization Imaging Applications C-AFM KPFM MFM

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About the book

Atomic force microscopy (AFM) has become well established as well as a widely accepted technique used in air, liquids, or vacuum to generate high-resolution topographic images of a surface having a nanometer-scale resolution. It is widely used in collecting valuable data in all areas: physics, chemistry, materials science, nanoscience and nanotechnology, and biotechnology, etc. AFM is generally operated in contact mode, tapping mode and the introduction of new advanced imaging modes has expanded applications of AFM such as electrical, magnetic, or mechanical properties at the nanoscale. AFM has a group of techniques used for non-destructive surface studies at the nanoscale. In addition, samples scanned by AFM require no special treatment and provides a three-dimensional surface profile.

This book intends to provide the reader with a comprehensive overview of the basic fundamentals of AFM, new results, and many applications in different areas where AFM has become a vital characterization technique. The book will be useful to a wide range of readers.

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About the editor

Chandra Shakher Pathak

Ben-Gurion University of the Negev

Dr. Chandra Shakher Pathak obtained his doctoral degree in Physics from Indian Institute of Technology, Delhi, India. He did his M.Sc. in Physics from Kumaun University Nainital, Uttarakhand and M.Tech. (Gold medalist) in Advanced Materials Science and Technology from NIT Durgapur, India. Dr. Pathak's research work lies in the area of nanomaterials, thin film growth, characterization and electronic devices. He has research experience in nanomaterials, organic-inorganic heterojunctions, Schottky diodes, 2D materials, conducting atomic force microscopy, Kelvin probe force microscopy and photovoltaics. Currently he is working on fabrication and stability of hybrid perovskite solar cells at Ben-Gurion National Solar Energy Center, Ben-Gurion University of the Negev, Israel. His bio-data has been published in Marquis Who’s who in the World 2014 (31th edition), Marquis Who’s who in the World 2015 (32nd edition) and Who's Who in Science and Engineering 2016-2017 (12th Edition).

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