About the book
Electromagnetic Pulse (EMP) events are a source of failure in electronic devices, components, and systems. Electromagnetic (EMP) events can lead to both soft failures and hard failures. Soft failures can include system interrupts or disturbs. Hard failures can include electronic device failures of both passive and active components. Hard failures can also include damage to components, printed circuit boards, to packaging. In this text, electromagnetic pulse (EMP) events will be discussed from event characteristics, Electromagnetic pulse (EMP) circuit simulations, EMP test simulations, EMP test equipment, electromagnetic pulse failure mechanisms, to electromagnetic pulse component and system solutions. Electromagnetic pulse standards will also be highlighted. This book aims to be a comprehensive text discussing electromagnetic pulse (EMP) historically to modern times; both articles from the past and present day are accepted to provide both history as well as present-day issues in both electronics from the past, to present day advanced technology issues.