Open access peer-reviewed Edited Volume

Electromagnetic Pulse

Steven Voldman

Dr. Steven H Voldman Limited Liability Company

Covering

Electromagnetic Pulse (EMP) Source Event Pulse Characteristics EMP Energy Source Commercial Testers Electrical Simulation Device Simulation EMP Standards Device Level Failures System Failure EMP Device Solutions EMP Component Protection

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About the book

Electromagnetic Pulse (EMP) events are a source of failure in electronic devices, components, and systems. Electromagnetic (EMP) events can lead to both soft failures and hard failures. Soft failures can include system interrupts or disturbs. Hard failures can include electronic device failures of both passive and active components. Hard failures can also include damage to components, printed circuit boards, to packaging. In this text, electromagnetic pulse (EMP) events will be discussed from event characteristics, Electromagnetic pulse (EMP) circuit simulations, EMP test simulations, EMP test equipment, electromagnetic pulse failure mechanisms, to electromagnetic pulse component and system solutions. Electromagnetic pulse standards will also be highlighted. This book aims to be a comprehensive text discussing electromagnetic pulse (EMP) historically to modern times; both articles from the past and present day are accepted to provide both history as well as present-day issues in both electronics from the past, to present day advanced technology issues. 

Publishing process

Book initiated and editor appointed

Date completed: July 9th 2019

Applications to edit the book are assessed and a suitable editor is selected, at which point the process begins.

Chapter proposals submitted and reviewed

Deadline Extended: Open for Submissions

Potential authors submit chapter proposals ready for review by the academic editor and our publishing review team.

Approved chapters written in full and submitted

Deadline for full chapters: September 28th 2019

Once approved by the academic editor and publishing review team, chapters are written and submitted according to pre-agreed parameters

Full chapters peer reviewed

Review results due: December 17th 2019

Full chapter manuscripts are screened for plagiarism and undergo a Main Editor Peer Review. Results are sent to authors within 30 days of submission, with suggestions for rounds of revisions.

Book compiled, published and promoted

Expected publication date: February 15th 2020

All chapters are copy-checked and typesetted before being published. IntechOpen regularly submits its books to major databases for evaluation and coverage, including the Clarivate Analytics Book Citation Index in the Web of ScienceTM Core Collection. Other discipline-specific databases are also targeted, such as Web of Science's BIOSIS Previews.

About the editor

Steven Voldman

Dr. Steven H Voldman Limited Liability Company

Dr. Steven H. Voldman is the first IEEE Fellow in the field of electrostatic discharge (ESD) for 'Contributions in ESD protection in CMOS, Silicon On Insulator and Silicon Germanium Technology.” He received his B.S. in Engineering Science from University of Buffalo (1979); a first M.S. EE (1981) from Massachusetts Institute of Technology (MIT); a second degree EE Degree (Engineer Degree) from MIT; a MS Engineering Physics (1986) and a Ph.D in electrical engineering (EE) (1991) from University of Vermont under IBM's Resident Study Fellow program. Voldman was a member of the semiconductor development of IBM, and consultant for Taiwan Semiconductor Manufacturing Corporation (TSMC), and Samsung Electronics Corporation. In 2018, he was a International Visiting Scholar in Khon Kaen University (KKU) in Thailand. He is a recipient of 262 issued US patents and has written over 150+ technical papers in the area of ESD, EOS, and CMOS latchup in journals and conference proceedings. Dr. Voldman is an author of ten book series on ESD, EOS and latchup, and a new text titled From Invention and Patent as well as a co-authored text on Radiation effects on semiconductors. He is an author of many book chapters on semiconductor technology.

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Book chapters authored 2

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Introducing your Author Service Manager

Ms. Dajana Pemac

As an Author Service Manager my responsibilities include monitoring and facilitating all publishing activities for authors and editors. From chapter submission and review, to approval and revision, copyediting and design, until final publication, I work closely with authors and editors to ensure a simple and easy publishing process. I maintain constant and effective communication with authors, editors and reviewers, which allows for a level of personal support that enables contributors to fully commit and concentrate on the chapters they are writing, editing, or reviewing. I assist authors in the preparation of their full chapter submissions and track important deadlines and ensure they are met. I help to coordinate internal processes such as linguistic review, and monitor the technical aspects of the process. As an ASM I am also involved in the acquisition of editors. Whether that be identifying an exceptional author and proposing an editorship collaboration, or contacting researchers who would like the opportunity to work with IntechOpen, I establish and help manage author and editor acquisition and contact.

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