Metrology

2 Open Access Books

42 Authors and Editors

29 Web of Science Citations

19 Dimensions Citations

Most cited chapters in this category

Chapter titleDownloads
1. Altmetrics: State of the Art and a Look into the Future

By Dirk Tunger, Marcel Clermont and Andreas Meier

Part of book: Scientometrics

922
2. Third-Order Nonlinear Optical Properties of Quantum Dots

By Khalil Ebrahim Jasim

Part of book: Standards, Methods and Solutions of Metrology

972
3. Metrological Traceability at Different Measurement Levels

By Oleh Velychko and Tetyana Gordiyenko

Part of book: Standards, Methods and Solutions of Metrology

676

Most downloaded chapters in this category in last 30 days

Chapter title
1. Altmetrics: State of the Art and a Look into the Future

By Dirk Tunger, Marcel Clermont and Andreas Meier

Part of book: Scientometrics

2. Patent Research in a Period of Industry Transformation: A Focus on Electromobility

By Zhao Qu

Part of book: Scientometrics

3. The Impact on Citation Analysis Based on Ontology and Linked Data

By Ming Xiao, Zeshun Shi and Shanshan Wang

Part of book: Scientometrics

4. Technology Roadmapping of Emerging Technologies: Scientometrics and Time Series Approach

By Iñaki Bildosola, Rosamaría Río-Bélver, Gaizka Garechana and Enara Zarrabeitia

Part of book: Scientometrics

5. Mapping Science Based on Research Content Similarity

By Takahiro Kawamura, Katsutaro Watanabe, Naoya Matsumoto and Shusaku Egami

Part of book: Scientometrics

6. Scientometrics of Scientometrics: Mapping Historical Footprint and Emerging Technologies in Scientometrics

By Meen Chul Kim and Yongjun Zhu

Part of book: Scientometrics

7. Patterns of Academic Scientific Collaboration at a Distance: Evidence from Southern European Countries

By Ana Fernández, Esther Ferrándiz and M. Dolores León

Part of book: Scientometrics

8. Third-Order Nonlinear Optical Properties of Quantum Dots

By Khalil Ebrahim Jasim

Part of book: Standards, Methods and Solutions of Metrology

9. Metrological Traceability at Different Measurement Levels

By Oleh Velychko and Tetyana Gordiyenko

Part of book: Standards, Methods and Solutions of Metrology

10. Exploring Characteristics of Patent-Paper Citations and Development of New Indicators

By Yasuhiro Yamashita

Part of book: Scientometrics