Dr. Dong-Hyun Kim is an associate professor of the Department of Electrical and Electronic Engineering at Yonsei University located in Seoul, Korea. He received his Bachelor’s degree from Yonsei University. He obtained his M.S. and Ph.D degree from Stanford University in the Department of Electrical Engineering specializing in ‘Technical developments for 1H in-vivo Magnetic Resonance Spectroscopic Imaging”. After completion of his training, he joined the faculty of Radiology at the University of California, San Francisco where he continued his research on Magnetic Resonance Spectroscopy (MRS) and Magnetic Resonance Spectroscopic Imaging (MRSI). Since 2006, he has been teaching and conducting research at Yonsei University. He has worked in the field of Magnetic Resonance Imaging (MRI) and MRS/MRSI for over ten years and has published numerous peer reviewed articles on the topic.