Ivanka Stanimirović

Vinča Institute of Nuclear Sciences, Serbia

Ivanka P. Stanimirović, Ph.D., has been involved in research and development work for more than 25 years. Currently, she is an associate research professor at the “Vinča” Institute of Nuclear Sciences – National Institute of the Republic of Serbia, University of Belgrade, Serbia. Dr. Stanimirović earned her MS and Ph.D. in Electrical Engineering from the Faculty of Electrical Engineering, University of Belgrade, in 1999 and 2007, respectively. Over the years, she has worked on several scientific projects funded by the Ministry of Science, Technological Development and Innovations of the Republic of Serbia. She is the recipient of the IEEE Transactions on Components & Packaging Technologies Best Paper Award. Her current research interests include materials science, micro/nanoscale sensors, and reliability issues in MEMS.

1books edited

5chapters authored

Latest work with IntechOpen by Ivanka Stanimirović

Temperature is the most often-measured environmental quantity and scientists are continuously improving ways of sensing it. To present their work in the field of temperature sensing, researchers from distant parts of the world have joined their efforts and contributed their ideas according to their interest and engagement. Their articles will give you the opportunity to understand concepts and uses of fiber-optic sensing technology. The optical fiber Mach-Zehnder interferometer for temperature sensing is presented, as well as the optical fiber-distributed temperature sensor and fiber Bragg grating-based sensor. You can learn about tunable diode laser absorption spectroscopy and its various industrial applications. Last but not least, cutting temperature measurements during the machining of aluminum alloys provides us with an insight into the correlation between cutting conditions, mechanical strength of the aluminum alloy, and the cutting temperature measured using the tool-workpiece thermocouple system. The editors hope that the presented contributions will allow both professionals and readers not involved in the immediate field to understand and enjoy the topic.

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Temperature Sensing

Edited by Ivanka Stanimirović

Chapters authored

Ceramic Injection Molding

By Zdravko Stanimirović and Ivanka Stanimirović

Part of the book: Some Critical Issues for Injection Molding

Optical MEMS for Telecommunications: Some Reliability Issues

By Ivanka Stanimirović and Zdravko Stanimirović

Part of the book: Advances in Micro/Nano Electromechanical Systems and Fabrication Technologies

Low‐Frequency Noise and Resistance as Reliability Indicators of Mechanically and Electrically Strained Thick‐Film Resistors

By Zdravko Stanimirović

New contemporary applications of thick resistive films are inducing the need to investigate their behaviour under various stressing conditions. On the other hand, there is a growing interest in noise measurements as means of thick‐film resistor quality and reliability evaluation and evaluation of degradation under stress. For these reasons, this chapter presents effects of mechanical, electrical and simultaneous mechanical and electrical straining on performances of conventional thick‐film resistors that are analysed from micro‐ and macro‐structural, charge transport and low‐frequency noise aspects.

Part of the book: System Reliability

Thick‐Film Resistor Failure Analysis Based on Low‐Frequency Noise Measurements

By Ivanka Stanimirović

The chapter aims to present research results in the field of thick‐film resistor failure analysis based on standard resistance and low‐frequency noise measurements. Noise spectroscopy–based analysis establishes correlation between noise parameters and parameters of noise sources in these heterogeneous nanostructures. Validity of the presented model is verified experimentally for resistors operating under extreme working conditions. For the experimental purposes, thick‐film resistors of different sheet resistances and geometries, realized using commercially available thick‐film resistor compositions, were subjected to high‐voltage pulse (HVP) stressing. The obtained experimental results are qualitatively analysed from microstructure, charge transport mechanism and low‐frequency noise aspects. Correlation between resistance and low‐frequency noise changes with resistor degradation and failure due to high‐voltage pulse stressing is observed.

Part of the book: Failure Analysis and Prevention

Introductory Chapter: Temperature Sensing - The Book

By Ivanka Stanimirović and Zdravko Stanimirović

Part of the book: Temperature Sensing

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