Ion beam material diagnostic possibilities are discussed. Experimental data of H+ and He+ ion beams interaction with material for the energy range 0.8–1.6 MeV are presented. There are described the conventional ion beam analytical complex facility and some peculiarities featured for Sokol-3 IMT RAS one. Common characteristics of ion beam analytical methods are described. Specific attention is focused on the ion beam methods use for real objects investigations. It is shown that these methods are very effective for the light element diagnostics. New technology for the element surface analysis on base of the PIXE method modification by the planar X-ray waveguide-resonator application is elaborated. Attention is drowning to facts that all ion beam experimental methods are nondestructive and the Rutherford backscattering spectrometry is real quantitative analytical procedure.
Part of the book: Ion Beam Applications
The work discussed shortly the experimental results, which was the waveguide-resonance mechanism relevation forerunner of characteristic X-ray radiation flux propagation. Technology of the planar air extended slit clearance preparation is presented. The methodology of X-ray beam parameter study formed by these slit clearances, which allowed to find the critical parameter answering for the radiation flux propagation mechanism change from the multiple external total reflections to the waveguide-resonance one, is described. Main features of the X-ray flux waveguide-resonance propagation mechanism were revealed. The self-consistent model of the mechanism is displayed with details. It is shown that the waveguide-resonance effect has universal character, and it reflects the fundamental nature phenomenon. The peculiarities of X-ray device functioned in frame of the phenomenon manifestation planar X-ray waveguide resonator (PXWR) and the increasing methods of its practical efficiency are discussed. The phenomenon practical application is presented concisely.