Boualem Djezzar

Dr. Boualem Djezzar, PhD, received the Diplôme des Etudes Supérieures (DES) in solid-state physics from the Uty of Constantine, Algeria; the Diplôme des Etudes Approfondies (DEA) in microelectronics from Uty of Grenoble, France; the MSc degree in thin film from Uty of Algiers, Algeria; and the PhD degree in microelectronics from Uty of Boumerdès, Algeria. He is currently affiliated with CDTA research center. He is the team leader of the semiconductor component reliability group. His current research interests include CMOS technology reliability, especially electrical characterization and modeling of radiation and NBTI effects. He is the author and coauthor of more than 70 papers published in refereed journals and refereed conference proceedings on characterization, modeling, and simulation of MOS device reliability.

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The benefits of ionizing radiations have been largely demonstrated through many achievements of human life. Understanding the fundamental elementary interactions of ionizing radiations with material has allowed the development of various applications needed by different industries. This book draws some facets of their applications, such as hardening process for semiconductor devices, biomedical imaging by radiation luminescent quantum dots, hydrogen gas detection by Raman lidar sensor for explosion risk assessment, water and wastewater purification by radiation treatment for environment, doping by the neutron transmutation doping for the semiconductor industry, and polymerization by irradiation, which is useful for industries requiring resistant and protective coating. I wish the chapters of this book can provide some helpful information on ionizing radiation applications.

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