Dr. Yasuto Hijikata is an associate professor of electrical and electronics systems engineering in Saitama University, Saitama, Japan, where he has taught for 13 years. He was born in Tokyo on April 1971 and received his doctor degree of engineering in light-wave sensing technology from Tokyo Institute of Technology in 1999. After that he arrived at Saitama University as an assistant professor. He was previously in the national research institute (CNR) in Italy as a guest researcher from October 2005 to March 2006. He has been the current position since 2006. Dr. Hijikata has been interest in characterizations of surfaces and interfaces of SiC semiconductor material for its device applications, especially on characterizations and processing of MOS interfaces as well as on the oxidation mechanism of SiC.