Received B.E., M.E. and Dr. Eng. degrees in Instrumentation Engineering, from Keio University, Yokohama, Japan, in 1982, 1984 and 1989, respectively. He is now a Professor in the Department of Applied Physics and Physico-Informatics, Keio University. His research interests are in image processing of medical image processing, biometric authentication, nondestructive inspection, GPS and its application and nonlinear problem. He is a member of IEEE, SICE, IEEJ and IEICE and so on.