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Statistical Prediction of Circuit Aging under Process Variations

Written By

Wenping Wang, Vijay Reddy, Varsha Balakrishnan, Srikanth Krishnan and Yu Cao

Published: January 1st, 2010

DOI: 10.5772/6875

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Written By

Wenping Wang, Vijay Reddy, Varsha Balakrishnan, Srikanth Krishnan and Yu Cao

Published: January 1st, 2010