Open access peer-reviewed chapter

Thermal Noise in Modern CMOS Technology

By Chih-Hung Chen

Published: January 1st 2010

DOI: 10.5772/6874

Downloaded: 9470

© 2010 The Author(s). Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution-NonCommercial-ShareAlike-3.0 License, which permits use, distribution and reproduction for non-commercial purposes, provided the original is properly cited and derivative works building on this content are distributed under the same license.

How to cite and reference

Link to this chapter Copy to clipboard

Cite this chapter Copy to clipboard

Chih-Hung Chen (January 1st 2010). Thermal Noise in Modern CMOS Technology, Solid State Circuits Technologies, Jacobus W. Swart, IntechOpen, DOI: 10.5772/6874. Available from:

chapter statistics

9470total chapter downloads

1Crossref citations

More statistics for editors and authors

Login to your personal dashboard for more detailed statistics on your publications.

Access personal reporting

Related Content

This Book

Next chapter

Statistical Prediction of Circuit Aging under Process Variations

By Wenping Wang, Vijay Reddy, Varsha Balakrishnan, Srikanth Krishnan and Yu Cao

Related Book

First chapter

Mixed-Mode S-Parameters and Conversion Techniques

By Allan Huynh, Magnus Karlsson and Shaofang Gong

We are IntechOpen, the world's leading publisher of Open Access books. Built by scientists, for scientists. Our readership spans scientists, professors, researchers, librarians, and students, as well as business professionals. We share our knowledge and peer-reveiwed research papers with libraries, scientific and engineering societies, and also work with corporate R&D departments and government entities.

More About Us