Open access

The Use of the Wavelet Transform to Extract Additional Information on Surface Quality from Optical Profilometers

Written By

Richard L. Lemaster

Submitted: 14 June 2011 Published: 04 April 2012

DOI: 10.5772/38154

From the Edited Volume

Advances in Wavelet Theory and Their Applications in Engineering, Physics and Technology

Edited by Dumitru Baleanu

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Written By

Richard L. Lemaster

Submitted: 14 June 2011 Published: 04 April 2012