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The Use of the Wavelet Transform to Extract Additional Information on Surface Quality from Optical Profilometers

Written By

Richard L. Lemaster

Submitted: June 14th, 2011 Published: April 4th, 2012

DOI: 10.5772/38154

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Written By

Richard L. Lemaster

Submitted: June 14th, 2011 Published: April 4th, 2012