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Material Characterization and Failure Analysis for Microelectronics Assembly Processes

Written By

Chien-Yi Huang, Ming-Shu Li, Shan-Yu Huang, Cheng-I Chang and Min-Hui Huang

Submitted: November 27th, 2010 Published: November 9th, 2011

DOI: 10.5772/23532

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Written By

Chien-Yi Huang, Ming-Shu Li, Shan-Yu Huang, Cheng-I Chang and Min-Hui Huang

Submitted: November 27th, 2010 Published: November 9th, 2011