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Application of Electrochemical Impedance Spectroscopy (EIS) and X-Ray Photoelectron Spectroscopy (XPS) to the Characterization of RTILs for Electrochemical Applications

Written By

J. Benavente and E. Rodríguez-Castellón

Submitted: June 15th, 2010 Published: February 21st, 2011

DOI: 10.5772/15704

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Written By

J. Benavente and E. Rodríguez-Castellón

Submitted: June 15th, 2010 Published: February 21st, 2011