TY - CHAP AU - Sumio Hosaka ED - Paul K Chu Y1 - 2010-04-01 PY - 2010 T1 - Scanning Near-Field Raman Spectroscopic Microscope N2 - This book brings together contributions from experts in the fields to describe the current status of important topics in solid-state circuit technologies. It consists of 20 chapters which are grouped under the following categories: general information, circuits and devices, materials, and characterization techniques. These chapters have been written by renowned experts in the respective fields making this book valuable to the integrated circuits and materials science communities. It is intended for a diverse readership including electrical engineers and material scientists in the industry and academic institutions. Readers will be able to familiarize themselves with the latest technologies in the various fields. BT - Advances in Solid State Circuit Technologies SP - Ch. 20 UR - https://doi.org/10.5772/8639 DO - 10.5772/8639 SN - PB - IntechOpen CY - Rijeka Y2 - 2024-03-28 ER -