TY - CHAP AU - Shan Yang ED - Chandra Shakher Pathak ED - Samir Kumar Y1 - 2021-10-28 PY - 2021 T1 - High-Wavenumber Raman Analysis N2 - This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy. BT - Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization SP - Ch. 6 UR - https://doi.org/10.5772/intechopen.100474 DO - 10.5772/intechopen.100474 SN - 978-1-83968-230-8 PB - IntechOpen CY - Rijeka Y2 - 2024-03-29 ER -